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Opto-Edu (Beijing) Co., Ltd. 0086-13911110627 sale@optoedu.com
Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range

Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range

  • Highlight

    opto edu scanning optical microscope

    ,

    all in one scanning optical microscope

  • Work Mode
    "Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode"
  • Current Spectrum Curve
    "RMS-Z Curve F-Z Force Curve"
  • XY Scan Range
    50×50um
  • XY Scan Resolution
    0.2nm
  • Z Scan Range
    5um
  • Y Scan Resolution
    0.05nm
  • Scan Speed
    0.6Hz~30Hz
  • Scan Angle
    0~360°
  • Sample Size
    "Φ≤90mm H≤20mm"
  • Optical Syestem
    "Eyepiece 10x Infinity Plan LWD APO 5x10x20x50x 5.0M Digital Camera 10"" LCD Monitor, With Measuring LED Kohler Illumination Coaxial Coarse & Fine Focusing"
  • Output
    USB2.0/3.0
  • Software
    Win XP/7/8/10
  • Place of Origin
    China
  • Brand Name
    OPTO-EDU
  • Certification
    CE, Rohs
  • Model Number
    A62.4505
  • Document
  • Minimum Order Quantity
    1pc
  • Price
    FOB $1~1000, Depend on Order Quantity
  • Packaging Details
    Carton Packing, For Export Transportation
  • Delivery Time
    5~20 Days
  • Payment Terms
    L/C,T/T,Western Union
  • Supply Ability
    5000 pcs/ Month

Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range

Opto Edu A62.4505 Scanning Optical Microscope All In One
Optical + Atomic Force Microscope, All-in-One
Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range 0
  • Integrated design of optical metallographic microscope and atomic force microscope with powerful functions
  • Combines optical microscope and atomic force microscope imaging functions that can work simultaneously without interference
  • Features both optical 2D measurement and atomic force microscope 3D measurement capabilities
  • Laser detection head and sample scanning stage are integrated for stable structure and strong anti-interference
  • Precision probe positioning device with easy laser spot alignment adjustment
  • Single-axis drive sample automatically approaches the probe vertically for perpendicular needle tip positioning
  • Motor-controlled pressurized piezoelectric ceramic automatic detection protects both probe and sample
  • Ultra-high magnification optical positioning system for precise probe and sample scanning area positioning
  • Integrated scanner nonlinear correction user editor
Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range 1 Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range 2 Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range 3 Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range 4 Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range 5 Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range 6 Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range 7
Specifications
Specification A62.4500 A622.4501 A62.4503 A62.4505
Work Mode Tapping Mode
【Optional】
Contact Mode
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode
Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode
Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode
Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode
Current Spectrum Curve
Output RMS-Z Curve
【Optional】
F-Z Force Curve
RMS-Z Curve
F-Z Force Curve
RMS-Z Curve
F-Z Force Curve
RMS-Z Curve
F-Z Force Curve
XY Scan Range 20×20um 20×20um 50×50um 50×50um
XY Scan Resolution 0.2nm 0.2nm 0.2nm 0.2nm
Z Scan Range 2.5um 2.5um 5um 5um
Y Scan Resolution 0.05nm 0.05nm 0.05nm 0.05nm
Scan Speed 0.6Hz~30Hz 0.6Hz~30Hz 0.6Hz~30Hz 0.6Hz~30Hz
Scan Angle 0~360° 0~360° 0~360° 0~360°
Sample Size Φ≤90mm
H≤20mm
Φ≤90mm
H≤20mm
Φ≤90mm
H≤20mm
Φ≤90mm
H≤20mm
XY Stage Moving 15×15mm 15×15mm 25×25um 25×25um
Shock-Absorbing Design Spring Suspension Spring Suspension
Metal Shielding Box
Spring Suspension
Metal Shielding Box
-
Optical System 4x Objective
Resolution 2.5um
4x Objective
Resolution 2.5um
4x Objective
Resolution 2.5um
Eyepiece 10x
Infinity Plan LWD APO 5x10x20x50x
5.0M Digital Camera
10" LCD Monitor, With Measuring
LED Kohler Illumination
Coaxial Coarse & Fine Focusing
Output USB2.0/3.0 USB2.0/3.0 USB2.0/3.0 USB2.0/3.0
Software Win XP/7/8/10 Win XP/7/8/10 Win XP/7/8/10 Win XP/7/8/10
Microscope Comparison
Microscope Optical Microscope Electron Microscope Scanning Probe Microscope
Max Resolution (um) 0.18 0.00011 0.00008
Remark Oil immersion 1500x Imaging diamond carbon atoms Imaging high-order graphitic carbon atoms
Image Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range 8 Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range 9
Probe-Sample Interaction
Force Measure Signal Information
Electrostatic Force Phase charge distribution
Tunnel Current Current Shape, Conductivity
Magnetic Force Phase Magnetic Structure
Technical Specifications Comparison
Resolution Working Condition Working Temperature Damage to Sample Inspection Depth
SPM Atom Level 0.1nm Normal, Liquid, Vacuum Room or Low Temperature None 1~2 Atom Level
SEM 6-10nm High Vacuum Room Temperature Small 10mm @10x
1um @10000x
FIM Atom Level 0.1nm Super High Vacuum 30~80K Damage Atom Thickness
Opto Edu A62.4505 All-in-One Microscope with 50×50um XY Scan Range 0.2nm XY Scan Resolution and 5um Z Scan Range 10