Optical + Atomic Force Microscope, All-in-One
◆ Integrated design of optical metallographic microscope and atomic force microscope, powerful functions
◆ It has both optical microscope and atomic force microscope imaging functions, both of which can work at the same time without affecting each other
◆ At the same time, it has the functions of optical 2D measurement and atomic force microscope 3D measurement
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◆ The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong
◆ Precision probe positioning device, laser spot alignment adjustment is very easy
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◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan
◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample
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◆ Ultra-high magnification optical positioning system to achieve precise positioning of probe and sample scanning area
◆ Integrated scanner nonlinear correction user editor, nanometer
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| Specification |
A62.4500 |
A622.4501 |
A62.4503 |
A62.4505 |
| Work Mode |
Tapping Mode
【Optional】
Contact Mode
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode |
Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode |
Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode |
Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode |
| Current Spectrum Curve |
RMS-Z Curve
【Optional】
F-Z Force Curve |
RMS-Z Curve
F-Z Force Curve |
RMS-Z Curve
F-Z Force Curve |
RMS-Z Curve
F-Z Force Curve |
| XY Scan Range |
20×20um |
20×20um |
50×50um |
50×50um |
| XY Scan Resolution |
0.2nm |
0.2nm |
0.2nm |
0.2nm |
| Z Scan Range |
2.5um |
2.5um |
5um |
5um |
| Y Scan Resolution |
0.05nm |
0.05nm |
0.05nm |
0.05nm |
| Scan Speed |
0.6Hz~30Hz |
0.6Hz~30Hz |
0.6Hz~30Hz |
0.6Hz~30Hz |
| Scan Angle |
0~360° |
0~360° |
0~360° |
0~360° |
| Sample Size |
Φ≤90mm
H≤20mm |
Φ≤90mm
H≤20mm |
Φ≤90mm
H≤20mm |
Φ≤90mm
H≤20mm |
| XY Stage Moving |
15×15mm |
15×15mm |
25×25um |
25×25um |
| Shock-Absorbing Design |
Spring Suspension |
Spring Suspension
Metal Shielding Box |
Spring Suspension
Metal Shielding Box |
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| Optical Syestem |
4x Objective
Resolution 2.5um |
4x Objective
Resolution 2.5um |
10x Objective
Resolution 1um |
Eyepiece 10x
Infinity Plan LWD APO 5x10x20x50x
5.0M Digital Camera
10" LCD Monitor, With Measuring
LED Kohler Illumination
Coaxial Coarse & Fine Focusing |
| Output |
USB2.0/3.0 |
USB2.0/3.0 |
USB2.0/3.0 |
USB2.0/3.0 |
| Software |
Win XP/7/8/10 |
Win XP/7/8/10 |
Win XP/7/8/10 |
Win XP/7/8/10 |
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| Microscope |
Optical Microscope |
Electron Microscope |
Scanning Probe Microscope |
| Max Resolution (um) |
0.18 |
0.00011 |
0.00008 |
| Remark |
Oil immersion 1500x |
Imaging diamond carbon atoms |
Imaging high-order graphitic carbon atoms |
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| Probe-Sample Interaction |
Measure Signal |
Information |
| Force |
Electrostatic Force |
Shape |
| Tunnel Current |
Current |
Shape, Conductivity |
| Magnetic Force |
Phase |
Magnetic Structure |
| Electrostatic Force |
Phase |
charge distribution |
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Resolution |
Working Condition |
Working Temperation |
Damge to Sample |
Inspection Depth |
| SPM |
Atom Level 0.1nm |
Normal, Liquid, Vacuum |
Room or Low Temperation |
None |
1~2 Atom Level |
| TEM |
Point 0.3~0.5nm
Lattice 0.1~0.2nm |
High Vaccum |
Room Temperation |
Small |
Usually <100nm |
| SEM |
6-10nm |
High Vaccum |
Room Temperation |
Small |
10mm @10x
1um @10000x |
| FIM |
Atom Level 0.1nm |
Super High Vaccum |
30~80K |
Damge |
Atom Thickness |
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