| A63.7001 Tungsten Filament Scanning Electron Microscope, SE+BSE, 150000x | |
| Resolution | 6nm@30KV(SE) |
| Magnification | 150000x |
| Electron Gun | Pre-Centered Tungsten Filament Cartridge |
| Voltage | Accelerating Voltage 1~15KV, Continuous Adjustable, Adjust Step 1KV |
| Detector | Standard: SE, BSE, CCD |
| Optional: EDS | |
| Vacuum System | Full Auto Control High Vaccum System, Vaccuming Time <2 Minutes |
| Specimen Stage | Standard XY Auto Stage, Travel Range 30x30mm, |
| Optional 5 Axes Stage | |
| Max Specimen | Ф50 x H35mm |
| Working Distance | 5-35mm |
| Condenser | Built-in Condenser No Need Manual Adjust Aperture (LaB6 Optional) |
| Image System | SE, BSE, BSE+SE(Mix) Scan Mode: 1. Video Mode: 512x512 Pixels, No Need Small Window Scan 2. Quick Mode: Scan Time <3s, 512x512 Pixels, 3. Slow Mode: Scan Time <40s, 2048x2048 Pixels, Image File Format: BMP, TIFF, JPG, PNG |
| Navigation | Optical CCD Navigation (Not Electrical Image Navigation) |
| Auto Function | One Key Auto Focus, Auto Brightness & Contrast Adjust |
| Computer & Software | PC Work Station Win 10 System, With Professional Image Analysis Software To Fully Control Whole SEM Microscope Operation, Computer Specification No Less Than Inter I5 3.2GHz, 4G Memory, 24" IPS LCD Monitor, 500G Hard Disk, Mouse, Keyboard |
| Working Condtion | 220V/50Hz 1KW, No Need Shock Absorbing Table |
| Dimension |
Microscope Body 283*553*505mm
Mechanical Pump 340*160*140mm |
| Optional Accessories | |
| A50.7002 | EDS Energy Dispersive X-Ray Spectrometer |
| A50.7011 | Ion Sputtering Coater |
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