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Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution

Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution

Products - Scanning Microscope
  • Highlight

    360 angle atomic force microscope

    ,

    research level atomic force microscope

    ,

    research level opto edu microscope

  • Work Mode
    "Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode"
  • Current Spectrum Curve
    "RMS-Z Curve F-Z Force Curve"
  • XY Scan Range
    50×50um
  • XY Scan Resolution
    0.2nm
  • Z Scan Range
    5um
  • Y Scan Resolution
    0.05nm
  • Scan Speed
    0.6Hz~30Hz
  • Scan Angle
    0~360°
  • Sample Size
    "Φ≤90mm H≤20mm"
  • Shock-Absorbing Design
    "Spring Suspension Metal Shielding Box"
  • Optical Syestem
    "10x Objective Resolution 1um"
  • Output
    USB2.0/3.0
  • Software
    Win XP/7/8/10
  • Place of Origin
    China
  • Brand Name
    OPTO-EDU
  • Certification
    CE, Rohs
  • Model Number
    A62.4503
  • Document
    Product Brochure PDF
  • Minimum Order Quantity
    1pc
  • Price
    FOB $1~1000, Depend on Order Quantity
  • Packaging Details
    Carton Packing, For Export Transportation
  • Delivery Time
    5~20 Days
  • Payment Terms
    L/C,T/T,Western Union
  • Supply Ability
    5000 pcs/ Month

Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution

  • Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution
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Opto Edu A62.4503 Atomic Force Microscope Research Level 360 Angle
The Opto Edu A62.4503 Atomic Force Microscope offers advanced research capabilities with 360° scan angle, featuring both Contact Mode and Tapping Mode operation. With exceptional scan resolution (XY 0.2nm, Z 0.05nm) and a wide scan range (XY 50×50μm, Z 5μm), this instrument delivers precise nanometer-scale measurements for demanding research applications.
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution 0 Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution 1
Key Features
  • Integrated laser detection head and sample scanning stage for maximum stability and interference resistance
  • Precision probe positioning device with easy laser spot alignment adjustment
  • Single-axis drive sample automatically approaches probe vertically for optimal alignment
  • Motor-controlled pressurized piezoelectric ceramic automatic detection for safe needle feeding
  • High-precision, wide-range piezoelectric ceramic scanners available for selection
  • High-magnification objective lens with automatic optical positioning for real-time observation
  • Spring suspension shockproof system for effective vibration damping
  • Metal shielded soundproof box with built-in temperature and humidity monitoring
  • Integrated scanner nonlinear correction editor with >98% measurement accuracy
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution 2 Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution 3
Technical Specifications
Specification A62.4500 A62.4501 A62.4503 A62.4505
Work Mode Tapping Mode
【Optional】Contact Mode, Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode		 Contact Mode, Tapping Mode
【Optional】Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode		 Contact Mode, Tapping Mode
【Optional】Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode		 Contact Mode, Tapping Mode
【Optional】Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode
Current Spectrum Curve RMS-Z Curve
【Optional】F-Z Force Curve		 RMS-Z Curve, F-Z Force Curve RMS-Z Curve, F-Z Force Curve RMS-Z Curve, F-Z Force Curve
XY Scan Range 20×20μm 20×20μm 50×50μm 50×50μm
XY Scan Resolution 0.2nm 0.2nm 0.2nm 0.2nm
Z Scan Range 2.5μm 2.5μm 5μm 5μm
Y Scan Resolution 0.05nm 0.05nm 0.05nm 0.05nm
Scan Speed 0.6Hz~30Hz 0.6Hz~30Hz 0.6Hz~30Hz 0.6Hz~30Hz
Scan Angle 0~360° 0~360° 0~360° 0~360°
Sample Size Φ≤90mm H≤20mm Φ≤90mm H≤20mm Φ≤90mm H≤20mm Φ≤90mm H≤20mm
XY Stage Moving 15×15mm 15×15mm 25×25μm 25×25μm
Shock-Absorbing Design Spring Suspension Spring Suspension, Metal Shielding Box Spring Suspension, Metal Shielding Box -
Optical System 4x Objective, Resolution 2.5μm 4x Objective, Resolution 2.5μm 4x Objective, Resolution 2.5μm Eyepiece 10x, Infinity Plan LWD APO 5x10x20x50x, 5.0M Digital Camera, 10" LCD Monitor, With Measuring, LED Kohler Illumination, Coaxial Coarse & Fine Focusing
Output USB2.0/3.0 USB2.0/3.0 USB2.0/3.0 USB2.0/3.0
Software Win XP/7/8/10 Win XP/7/8/10 Win XP/7/8/10 Win XP/7/8/10
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution 4
Microscope Technology Comparison
Resolution Working Condition Working Temperature Damage to Sample Inspection Depth
SPM Atom Level 0.1nm Normal, Liquid, Vacuum Room or Low Temperature None 1~2 Atom Level
TEM Point 0.3-0.5nm, Lattice 0.1-0.2nm High Vacuum Room Temperature Small Usually <100nm
SEM 6-10nm High Vacuum Room Temperature Small 10mm @10x, 1μm @10000x
FIM Atom Level 0.1nm Super High Vacuum 30-80K Damage Atom Thickness
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution 5 Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution 6 Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution 7
Probe-Sample Interaction Analysis
Probe-Sample Interaction Measure Signal Information
Force Electrostatic Force Shape
Tunnel Current Current Shape, Conductivity
Magnetic Force Phase Magnetic Structure
Electrostatic Force Phase Charge Distribution
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution 8 Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution 9 Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution 10 Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution 11
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Hand held Digital Microscope

hand held microscope

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