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Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um

Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um

Products - Scanning Microscope
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    curve basic level scanning microscope

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    atomic force scanning microscope

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    scanning opto edu microscope

  • Work Mode
    "Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode"
  • Current Spectrum Curve
    "RMS-Z Curve F-Z Force Curve"
  • XY Scan Range
    20×20um
  • XY Scan Resolution
    0.2nm
  • Z Scan Range
    2.5um
  • Y Scan Resolution
    0.05nm
  • Scan Speed
    0.6Hz~30Hz
  • Scan Angle
    0~360°
  • Sample Size
    "Φ≤90mm H≤20mm"
  • Shock-Absorbing Design
    "Spring Suspension Metal Shielding Box"
  • Optical Syestem
    "4x Objective Resolution 2.5um"
  • Output
    USB2.0/3.0
  • Software
    Win XP/7/8/10
  • Place of Origin
    China
  • Brand Name
    OPTO-EDU
  • Certification
    CE, Rohs
  • Model Number
    A62.4501
  • Document
    Product Brochure PDF
  • Minimum Order Quantity
    1pc
  • Price
    FOB $1~1000, Depend on Order Quantity
  • Packaging Details
    Carton Packing, For Export Transportation
  • Delivery Time
    5~20 Days
  • Payment Terms
    L/C,T/T,Western Union
  • Supply Ability
    5000 pcs/ Month

Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um

  • Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um
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Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force
Product Overview
  • Basic Level system with separate controller and main body design
  • Supports Contact Mode and Tapping Mode operation
  • XY Scan Range: 20×20μm with 0.2nm resolution
  • Z Scan Range: 2.5μm with 0.05nm resolution
  • Sample Size: Diameter <90mm, Height <20mm
  • Stage Movement: 15×15mm
  • Optical Objective: APO 4x with 2.5μm resolution
  • Scan Speed: 0.6~30Hz with 0-360° scan angle
  • Output: USB3.0 compatible with Windows 7/8/10/11
  • Optional Work Modes: Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode
Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um 0 Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um 1
Key Features
The laser detection head and sample scanning stage are integrated for maximum stability and interference resistance
  • Precision probe positioning device for easy laser spot alignment adjustment
  • Single-axis drive sample automatically approaches probe vertically for perpendicular needle tip alignment
  • Motor-controlled pressurized piezoelectric ceramic automatic detection protects both probe and sample
  • High-precision, wide-range piezoelectric ceramic scanners available for selection
  • High-magnification objective lens with automatic optical positioning - no focusing required
  • Spring suspension shockproof design provides excellent vibration damping
  • Metal shielded soundproof box with built-in temperature and humidity sensors
  • Integrated scanner nonlinear correction user editor with nanometer characterization accuracy better than 98%
Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um 2 Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um 3
Technical Specifications
Specification A62.4500 A62.4501 A62.4503 A62.4505
Work Mode Tapping Mode
【Optional】
Contact Mode
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		 Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		 Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		 Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode
Current Spectrum Curve RMS-Z Curve
【Optional】
F-Z Force Curve		 RMS-Z Curve
F-Z Force Curve		 RMS-Z Curve
F-Z Force Curve		 RMS-Z Curve
F-Z Force Curve
XY Scan Range 20×20μm 20×20μm 50×50μm 50×50μm
XY Scan Resolution 0.2nm 0.2nm 0.2nm 0.2nm
Z Scan Range 2.5μm 2.5μm 5μm 5μm
Y Scan Resolution 0.05nm 0.05nm 0.05nm 0.05nm
Scan Speed 0.6Hz~30Hz 0.6Hz~30Hz 0.6Hz~30Hz 0.6Hz~30Hz
Scan Angle 0~360° 0~360° 0~360° 0~360°
Sample Size Φ≤90mm
H≤20mm		 Φ≤90mm
H≤20mm		 Φ≤90mm
H≤20mm		 Φ≤90mm
H≤20mm
XY Stage Moving 15×15mm 15×15mm 25×25μm 25×25μm
Shock-Absorbing Design Spring Suspension Spring Suspension
Metal Shielding Box		 Spring Suspension
Metal Shielding Box		 -
Optical System 4x Objective
Resolution 2.5μm		 4x Objective
Resolution 2.5μm		 4x Objective
Resolution 2.5μm		 Eyepiece 10x
Infinity Plan LWD APO 5x10x20x50x
5.0M Digital Camera
10" LCD Monitor, With Measuring
LED Kohler Illumination
Coaxial Coarse & Fine Focusing
Output USB2.0/3.0 USB2.0/3.0 USB2.0/3.0 USB2.0/3.0
Software Win XP/7/8/10 Win XP/7/8/10 Win XP/7/8/10 Win XP/7/8/10
Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um 4
Microscope Technology Comparison
Resolution Working Condition Working Temperature Damage to Sample Inspection Depth
SPM
Atom Level 0.1nm		 Normal, Liquid, Vacuum Room or Low Temperature None 1~2 Atom Level
TEM
Point 0.3~0.5nm
Lattice 0.1~0.2nm		 High Vacuum Room Temperature Small Usually <100nm
SEM
6-10nm		 High Vacuum Room Temperature Small 10mm @10x
1μm @10000x
FIM
Atom Level 0.1nm		 Super High Vacuum 30~80K Damage Atom Thickness
Microscope Optical Microscope Electron Microscope Scanning Probe Microscope
Max Resolution (μm) 0.18 0.00011 0.00008
Remark Oil immersion 1500x Imaging diamond carbon atoms Imaging high-order graphitic carbon atoms
Image Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um 5 Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um 6 Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um 7
Probe-Sample Interaction Measure Signal Information
Force Electrostatic Force Shape
Tunnel Current Current Shape, Conductivity
Magnetic Force Phase Magnetic Structure
Electrostatic Force Phase charge distribution
Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um 8 Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um 9 Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um 10 Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um 11
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Portable Digital Microscope

Hand held Digital Microscope

hand held microscope

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