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Opto Edu Teaching Level Atomic Force Microscope with 20×20um XY Scan Range 0.2nm Resolution and 2.5um Z Scan Range

Opto Edu Teaching Level Atomic Force Microscope with 20×20um XY Scan Range 0.2nm Resolution and 2.5um Z Scan Range

Products - Scanning Microscope
  • Highlight

    teaching opto edu microscope

    ,

    tapping mode opto edu microscope

  • Work Mode
    "Tapping Mode 【Optional】 Contact Mode Friction Mode Phase Mode Magnetic Mode Electrostatic Mode"
  • Current Spectrum Curve
    "RMS-Z Curve 【Optional】 F-Z Force Curve"
  • XY Scan Range
    20×20um
  • XY Scan Resolution
    0.2nm
  • Z Scan Range
    2.5um
  • Y Scan Resolution
    0.05nm
  • Scan Speed
    0.6Hz~30Hz
  • Scan Angle
    0~360°
  • Sample Size
    "Φ≤90mm H≤20mm"
  • Shock-Absorbing Design
    Spring Suspension
  • Optical Syestem
    "4x Objective Resolution 2.5um"
  • Output
    USB2.0/3.0
  • Software
    Win XP/7/8/10
  • Place of Origin
    China
  • Brand Name
    OPTO-EDU
  • Certification
    CE, Rohs
  • Model Number
    A62.4500
  • Document
    Product Brochure PDF
  • Minimum Order Quantity
    1pc
  • Price
    FOB $1~1000, Depend on Order Quantity
  • Packaging Details
    Carton Packing, For Export Transportation
  • Delivery Time
    5~20 Days
  • Payment Terms
    L/C,T/T,Western Union
  • Supply Ability
    5000 pcs/ Month

Opto Edu Teaching Level Atomic Force Microscope with 20×20um XY Scan Range 0.2nm Resolution and 2.5um Z Scan Range

  • Opto Edu Teaching Level Atomic Force Microscope with 20×20um XY Scan Range 0.2nm Resolution and 2.5um Z Scan Range
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A62.4500 Opto Edu Microscope Tapping Mode Rms-Z Curve Teaching Level Atomic Force
Teaching Level Atomic Force Microscope
  • Teaching Level Separate controller & main body design with Tapping Mode, 4x Objective, Miniaturized Detachable Design
  • Integrated laser detection head and sample scanning stage for stable structure and strong anti-interference
  • Motor-controlled pressurized piezoelectric ceramic automatic detection for intelligent needle feeding, protecting both probe and sample
  • Automatic optical positioning eliminates the need for manual focusing, enabling real-time observation of probe sample scanning area
  • Spring suspension shockproof method provides simple yet effective vibration isolation
Opto Edu Teaching Level Atomic Force Microscope with 20×20um XY Scan Range 0.2nm Resolution and 2.5um Z Scan Range 0
Opto Edu Teaching Level Atomic Force Microscope with 20×20um XY Scan Range 0.2nm Resolution and 2.5um Z Scan Range 1
Key Features:
  • ◆ Precision probe positioning device with easy laser spot alignment adjustment
  • ◆ Single-axis drive sample automatically approaches probe vertically for perpendicular needle tip alignment
  • ◆ Metal shielded soundproof box with built-in high-precision temperature and humidity sensor for environmental monitoring
  • ◆ Integrated scanner nonlinear correction user editor with nanometer characterization accuracy better than 98%
Opto Edu Teaching Level Atomic Force Microscope with 20×20um XY Scan Range 0.2nm Resolution and 2.5um Z Scan Range 2
Opto Edu Teaching Level Atomic Force Microscope with 20×20um XY Scan Range 0.2nm Resolution and 2.5um Z Scan Range 3
Technical Specifications
Specification A62.4500 A622.4501 A62.4503 A62.4505
Work Mode Tapping Mode
【Optional】
Contact Mode
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		 Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		 Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		 Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode
Current Spectrum Curve RMS-Z Curve
【Optional】
F-Z Force Curve		 RMS-Z Curve
F-Z Force Curve		 RMS-Z Curve
F-Z Force Curve		 RMS-Z Curve
F-Z Force Curve
XY Scan Range 20×20μm 20×20μm 50×50μm 50×50μm
XY Scan Resolution 0.2nm 0.2nm 0.2nm 0.2nm
Z Scan Range 2.5μm 2.5μm 5μm 5μm
Y Scan Resolution 0.05nm 0.05nm 0.05nm 0.05nm
Scan Speed 0.6Hz~30Hz 0.6Hz~30Hz 0.6Hz~30Hz 0.6Hz~30Hz
Scan Angle 0~360° 0~360° 0~360° 0~360°
Sample Size Φ≤90mm
H≤20mm		 Φ≤90mm
H≤20mm		 Φ≤90mm
H≤20mm		 Φ≤90mm
H≤20mm
XY Stage Moving 15×15mm 15×15mm 25×25μm 25×25μm
Shock-Absorbing Design Spring Suspension Spring Suspension
Metal Shielding Box		 Spring Suspension
Metal Shielding Box		 -
Optical System 4x Objective
Resolution 2.5μm		 4x Objective
Resolution 2.5μm		 4x Objective
Resolution 2.5μm		 Eyepiece 10x
Infinity Plan LWD APO 5x10x20x50x
5.0M Digital Camera
10" LCD Monitor, With Measuring
LED Kohler Illumination
Coaxial Coarse & Fine Focusing
Output USB2.0/3.0 USB2.0/3.0 USB2.0/3.0 USB2.0/3.0
Software Win XP/7/8/10 Win XP/7/8/10 Win XP/7/8/10 Win XP/7/8/10
Microscope Technology Comparison
Microscope Optical Microscope Electron Microscope Scanning Probe Microscope
Max Resolution (μm) 0.18 0.00011 0.00008
Remark Oil immersion 1500x Imaging diamond carbon atoms Imaging high-order graphitic carbon atoms
Opto Edu Teaching Level Atomic Force Microscope with 20×20um XY Scan Range 0.2nm Resolution and 2.5um Z Scan Range 4
Probe-Sample Interaction Analysis
Probe-Sample Interaction Measure Signal Information
Force Electrostatic Force Shape
Tunnel Current Current Shape, Conductivity
Magnetic Force Phase Magnetic Structure
Electrostatic Force Phase charge distribution
Microscope Performance Characteristics
Resolution Working Condition Working Temperature Damage to Sample Inspection Depth
SPM Atom Level 0.1nm Normal, Liquid, Vacuum Room or Low Temperature None 1~2 Atom Level
TEM Point 0.3~0.5nm
Lattice 0.1~0.2nm		 High Vacuum Room Temperature Small Usually <100nm
SEM 6-10nm High Vacuum Room Temperature Small 10mm @10x
1μm @10000x
FIM Atom Level 0.1nm Super High Vacuum 30~80K Damage Atom Thickness
Opto Edu Teaching Level Atomic Force Microscope with 20×20um XY Scan Range 0.2nm Resolution and 2.5um Z Scan Range 5
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Portable Digital Microscope

Hand held Digital Microscope

hand held microscope

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