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Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode

Products - Scanning Microscope
  • Highlight

    opto edu scanning tunneling electron microscope

    ,

    constant height scanning tunneling electron microscope

    ,

    current mode opto edu microscope

  • Work Mode
    "Constant Height Mode Constant Current Mode"
  • Current Spectrum Curve
    " I-V Curve Current-Distance Curve"
  • XY Scan Range
    5×5um
  • XY Scan Resolution
    0.05nm
  • Z Scan Range
    1um
  • Y Scan Resolution
    0.01nm
  • Scan Speed
    0.1Hz~62Hz
  • Scan Angle
    0~360°
  • Sample Size
    "Φ≤68mm H≤20mm "
  • XY Stage Moving
    15×15mm
  • Shock-Absorbing Design
    Spring Suspension
  • Optical Syestem
    1~500x Continous Zoom
  • Output
    USB2.0/3.0
  • Software
    Win XP/7/8/10
  • Place of Origin
    China
  • Brand Name
    OPTO-EDU
  • Certification
    CE, Rohs
  • Model Number
    A61.4510
  • Document
    Product Brochure PDF
  • Minimum Order Quantity
    1pc
  • Price
    FOB $1~1000, Depend on Order Quantity
  • Packaging Details
    Carton Packing, For Export Transportation
  • Delivery Time
    5~20 Days
  • Payment Terms
    L/C, Western Union, T/T, MoneyGram
  • Supply Ability
    5000 pcs/ Month

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode

  • Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode
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Scanning Tunneling Microscope

  • Miniaturized and detachable design, very easy to carry and classroom teaching
  • The detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong
  • The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample
  • Side CCD observation system, real-time observation of probe needle insertion status and positioning of probe sample scanning area
  • Spring suspension shockproof method, simple and practical, good shockproof effect

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode 0

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode 1

           ◆ Miniaturized and detachable design, very easy to carry and classroom teaching

 

           ◆ The detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong

 

           ◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan

 

           ◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample

 

           ◆ Side CCD observation system, real-time observation of the probe needle insertion state and positioning of the probe sample scanning area

 

           ◆ Spring suspension shockproof method, simple and practical, good shockproof effect

 

           ◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode 2

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode 3

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode 4

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode 5

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode 6

 

A61.4510
Work Mode Constant Height Mode
Constant Current Mode
Current Spectrum Curve I-V Curve
Current-Distance Curve
XY Scan Range 5×5um
XY Scan Resolution 0.05nm
Z Scan Range 1um
Y Scan Resolution 0.01nm
Scan Speed 0.1Hz~62Hz
Scan Angle 0~360°
Sample Size Φ≤68mm
H≤20mm
XY Stage Moving 15×15mm
Shock-Absorbing Design Spring Suspension
Optical Syestem 1~500x Continous Zoom
Output USB2.0/3.0
Software Win XP/7/8/10
Microscope Optical Microscope Electron Microscope Scanning Probe Microscope
Max Resolution (um) 0.18 0.00011 0.00008
Remark Oil immersion 1500x Imaging diamond carbon atoms Imaging high-order graphitic carbon atoms
Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode 7 Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode 8 Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode 9
Probe-Sample Interaction Measure Signal Information
Force Electrostatic Force Shape
Tunnel Current Current Shape, Conductivity
Magnetic Force Phase Magnetic Structure
Electrostatic Force Phase charge distribution
　 Resolution Working Condition Working Temperation Damge to Sample Inspection Depth
SPM Atom Level 0.1nm Normal, Liquid, Vacuum Room or Low Temperation None 1~2 Atom Level
TEM Point 0.3~0.5nm
Lattice 0.1~0.2nm		 High Vaccum Room Temperation Small Usually <100nm
SEM 6-10nm High Vaccum Room Temperation Small 10mm @10x
1um @10000x
FIM Atom Level 0.1nm Super High Vaccum 30~80K Damge Atom Thickness

 

Tags:

Portable Digital Microscope

Hand held Digital Microscope

hand held microscope

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