Specification | A62.4500 | A62.4501 | A62.4503 | A62.4505 |
---|---|---|---|---|
Work Mode | Tapping Mode 【Optional】 Contact Mode, Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode | Contact Mode, Tapping Mode 【Optional】 Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode | Contact Mode, Tapping Mode 【Optional】 Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode | Contact Mode, Tapping Mode 【Optional】 Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode |
Current Spectrum Curve | RMS-Z Curve 【Optional】 F-Z Force Curve | RMS-Z Curve, F-Z Force Curve | RMS-Z Curve, F-Z Force Curve | RMS-Z Curve, F-Z Force Curve |
XY Scan Range | 20×20μm | 20×20μm | 50×50μm | 50×50μm |
XY Scan Resolution | 0.2nm | 0.2nm | 0.2nm | 0.2nm |
Z Scan Range | 2.5μm | 2.5μm | 5μm | 5μm |
Y Scan Resolution | 0.05nm | 0.05nm | 0.05nm | 0.05nm |
Scan Speed | 0.6Hz~30Hz | 0.6Hz~30Hz | 0.6Hz~30Hz | 0.6Hz~30Hz |
Scan Angle | 0~360° | 0~360° | 0~360° | 0~360° |
Sample Size | Φ≤90mm H≤20mm | Φ≤90mm H≤20mm | Φ≤90mm H≤20mm | Φ≤90mm H≤20mm |
XY Stage Moving | 15×15mm | 15×15mm | 25×25μm | 25×25μm |
Shock-Absorbing Design | Spring Suspension | Spring Suspension, Metal Shielding Box | Spring Suspension, Metal Shielding Box | - |
Optical System | 4x Objective Resolution 2.5μm | 4x Objective Resolution 2.5μm | 4x Objective Resolution 2.5μm | Eyepiece 10x Infinity Plan LWD APO 5x10x20x50x 5.0M Digital Camera 10" LCD Monitor, With Measuring LED Kohler Illumination Coaxial Coarse & Fine Focusing |
Output | USB2.0/3.0 | USB2.0/3.0 | USB2.0/3.0 | USB2.0/3.0 |
Software | Win XP/7/8/10 | Win XP/7/8/10 | Win XP/7/8/10 | Win XP/7/8/10 |
Resolution | Working Condition | Working Temperature | Damage to Sample | Inspection Depth |
---|---|---|---|---|
SPM Atom Level 0.1nm | Normal, Liquid, Vacuum | Room or Low Temperature | None | 1~2 Atom Level |
TEM Point 0.3~0.5nm Lattice 0.1~0.2nm | High Vacuum | Room Temperature | Small | Usually <100nm |
SEM 6-10nm | High Vacuum | Room Temperature | Small | 10mm @10x 1μm @10000x |
FIM Atom Level 0.1nm | Super High Vacuum | 30~80K | Damage | Atom Thickness |
Microscope | Optical Microscope | Electron Microscope | Scanning Probe Microscope |
---|---|---|---|
Max Resolution (μm) | 0.18 | 0.00011 | 0.00008 |
Remark | Oil immersion 1500x | Imaging diamond carbon atoms | Imaging high-order graphitic carbon atoms |
Image | ![]() | ![]() | ![]() |
Probe-Sample Interaction | Measure Signal | Information |
---|---|---|
Force | Electrostatic Force | Shape |
Tunnel Current | Current | Shape, Conductivity |
Magnetic Force | Phase | Magnetic Structure |
Electrostatic Force | Phase | charge distribution |