Payment & Shipping Terms:
|Operation Modes:||Contact Mode, Tapping Mode,phase,friction, MFM,EFM||Sample Size:||Radius≤90mm,H≤20mm|
|Max. Scan Range:||X/Y: 50μm, Z: 5μm||Resolution:||X/Y: 0.2 Nm, Z: 0.05nm|
|Scan Rate:||0.6Hz~4.34Hz||Scanning Control:||XY: 18-bit D/A, Z: 16-bit D/A|
|Data Sampling:||One 14-bit A/D And Double 16-bit A/D Multiple-channel Simultaneously||Windows:||USB2.0, Compatible With Windows 98/2000/XP/7/8|
|Name:||Laboratory Research New Atomic Force Scanning Electron Microscope||Features::||All-in-one Design, Smart Structure And Shape.|
binocular compound microscope,
wide field microscope
1. All-in-one design, smart structure and shape.
2. Scan head and sample stage are designed together, strong anti-vibration performance.
3. Precision laser detection and probe alignment device make laser adjustment simple and easy.
4. Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
5. High-accuracy and large range sample transfer device allow to scan any interesting area of sample.
6. Different types of scanner meets different customer's requirements in accuracy and scan size.
7. optical observation system for tip check and sample positioning.
8. CCD observing system for real-time sample area observing and position.
9. Use servomotor to achieve CCD auto-focusing.
10. Electronic system is designed as modular and easy for maintenance and development.
11. Integrated with many working modes control electronics for further development.
User-friendly software and functions
1. Multi-channels images are capture and display synchronous, observe profile map in real time.
2. Obtain and measure many curves such as F-Z, F-RMS, RMS-Z 3. Execute scan area move and cut function, choose any interesting area of sample.
4. Scan sample in random angle at beginning.
5. Adjust the laser spot detection system in real time.
6. Search the resonance frequency of tip manually or automatically.
7. Choose and set different color of scanning image in palette.
8. Support linear average and offset calibration in real time for sample title.
9. Support scanner sensitivity calibration and electronic controller auto-calibration.
OPTO-EDU, as one of the most professional manufacturer and supplier of microscope in China, our sub-brand CNOPTEC series high end biological, laboratory, polarizing, metallurgical, fluorescene microscopes, CNCOMPARISON series forensic microscope, A63 series SEM microscope, and .49 series digital camera, LCD camera are very popular in the world market.
Contact Person: Mr. Huang Xin