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High Resolution Digital Optical Microscope Upgradeable Lab6 Huge Sample Stage

China Opto-Edu (Beijing) Co., Ltd. certification
China Opto-Edu (Beijing) Co., Ltd. certification
We are very happy with the product we purchased. In addition, both the service and the shipping were prompt. Thank you.

—— Aidan Andrews, U.K.

I have been so pleased with my A12.0203 lab microscope, its professional design and optical system is so valuable compare to its competitive price.

—— Luis Guzmán, Germany

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High Resolution Digital Optical Microscope Upgradeable Lab6 Huge Sample Stage

High Resolution Digital Optical Microscope Upgradeable Lab6 Huge Sample Stage
High Resolution Digital Optical Microscope Upgradeable Lab6 Huge Sample Stage High Resolution Digital Optical Microscope Upgradeable Lab6 Huge Sample Stage High Resolution Digital Optical Microscope Upgradeable Lab6 Huge Sample Stage High Resolution Digital Optical Microscope Upgradeable Lab6 Huge Sample Stage High Resolution Digital Optical Microscope Upgradeable Lab6 Huge Sample Stage

Large Image :  High Resolution Digital Optical Microscope Upgradeable Lab6 Huge Sample Stage

Product Details:
Place of Origin: China
Brand Name: OPTO-EDU
Certification: CE, Rohs
Model Number: A63.7069
Payment & Shipping Terms:
Minimum Order Quantity: 1 pc
Price: FOB $1~1000, Depend on Order Quantity
Packaging Details: Carton Packing, For Export Transportation
Delivery Time: 5~20 Days
Payment Terms: T/T, West Union, Paypal
Supply Ability: 5000 pcs/ Month
Detailed Product Description
Resolution: 3nm@30KV(SE); 6nm@30KV(BSE) Magnification: Negative Magnification: 8x~300000x; Screen Magnification: 12x~600000x
Electron Gun: Tungsten Heated Cathode-Pre Centered Tungsten Filament Cartridge Accelerating Voltage: 0~30KV
Objective Aperture: Molybdenum Aperture Adjustable Outside Vacuum System Specimen Stage: Five Axes Stage
High Light:

digital usb microscope

,

optical microscope with digital camera

 
  • 8x~300000x With Detector SED+BSED+CCD, Five Axes Stage (Auto X/Y, Manual Z/R/T)
  • Upgradeable LaB6, X-Ray Detector, EBSD, CL, WDS, Coating Machine And Etc.
  • Multi Modification EBL, STM, AFTM, Heatign Stage, Cryo Stage, Tensile Stage, SEM+Laser And Etc.
  • Auto Calibration, Auto Faulty Detection, Low Cost For Maintain & Repair
  • Easy & Friendly Operation Interface, All Controled By Mouse In Computer Windows System (Included)
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A63.7069 Software Main Function
High pressure regulation Vertical line scan  Potential shift regulation
Filament current regulation Condenser adjustment  Multi scale measurement
Astigmatic adjustment Electric to central adjustment Automatic brightness / contrast
Brightness adjustment Objective lens adjustment Auto focus
Contrast adjustment Photo Preview Automatic astigmatism elimination
Magnification adjustment Active ruler Automatic filament adjustment
Selected area scanning mode 4 Scanning speed setting Management of parameters
Point scanning mode Objective lens inversion  Image snapshot, image freezing
Surface scanning Condenser reversal One Key Quick View 
Horizontal line scanning Electric rotation adjustment  
 

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SEM A63.7069  A63.7080 A63.7081
Resolution 3nm@30KV(SE)
6nm@30KV(BSE)
1.5nm@30KV(SE)
3nm@30KV(BSE)
1.0nm@30KV(SE)
3.0nm@1KV(SE)
2.5nm@30KV(BSE)
Magnification 8x~300000x Negative True Magnification 8x~800000x Negative True Magnification 6x~1000000x Negative True Magnification
Electron Gun Pre-Centered Tungsten Filament Cartridge Schottky Field Emission Gun Schottky Field Emission Gun
Voltage Accelerating Voltage 0~30KV, Continuous Adjustable, Adjust Step 100V@0-10Kv, 1KV@10-30KV 
Quick View One Key Quick View Image Function N/A N/A
Lens System Three-levels Electromagnetic Tapered Lens Multi-levels Electromagnetic Tapered Lens
Aperture 3 Molybdenum Objective Apertures, Adjustable Outside Of Vacuum System, No Need Disassemble Objective To Change Aperture 
Vacuum System 1 Turbo Molecular Pump
1 Mechanical Pump
Sample Room Vacuum>2.6E-3Pa
Electron Gun Room Vacuum>2.6E-3Pa
Fully Auto Vacuum Control
Vacuum Interlock Function

Optional Model: A63.7069-LV
1 Turbo Molecular Pump
2 Mechanical Pumps
Sample Room Vacuum>2.6E-3Pa
Electron Gun Room Vacuum>2.6E-3Pa
Fully Auto Vacuum Control
Vacuum Interlock Function

Low Vacuum Range 10~270Pa For Quick Switch in 90 Seconds For BSE(LV) 
1 Ion Pump Set
1 Turbo Molecular Pump
1 Mechanical Pump
Sample Room Vacuum>6E-4Pa
Electron Gun Room Vacuum>2E-7 Pa
Fully Auto Vacuum Control
Vacuum Interlock Function
1 Sputter Ion Pump
1 Getter Ion Compound Pump
1 Turbo Molecular Pump
1 Mechanical Pump
Sample Room Vacuum>6E-4Pa
Electron Gun Room Vacuum>2E-7 Pa
Fully Auto Vacuum Control
Vacuum Interlock Function
Detector SE: High Vacuum Secondary Electron Detector (With Detector Protection) SE: High Vacuum Secondary Electron Detector (With Detector Protection) SE: High Vacuum Secondary Electron Detector (With Detector Protection)
BSE: Semiconductor 4 Segmentation
Back Scattering Detector


Optional Model: A63.7069-LV
BSE(LV): Semiconductor 4 Segmentation
Back Scattering Detector
Optional Optional
CCD: Infrared CCD Camera CCD: Infrared CCD Camera CCD: Infrared CCD Camera
Extend Port 2 Extend Ports On Sample Room For
EDS, BSD, WDS etc.
4 Extend Ports On Sample Room For
BSE, EDS, BSD, WDS etc.
4 Extend Ports On Sample Room For
BSE, EDS, BSD, WDS etc.
Specimen Stage 5 Axes Stage, 4 Auto +1 Manual Control
Travel Range:
X=70mm, Y=50mm, Z=45mm,
R=360°, T=-5°~+90°(Manual)
Touch Alert & Stop Function
5 Axes Auto Middle Stage
Travel Range:
X=80mm, Y=50mm, Z=30mm,
R=360°, T=-5°~+70°
Touch Alert & Stop Function

Optional Model:

A63.7080-M 5 Axes Manual Stage
A63.7080-L 5 Axes Auto Large Stage
5 Axes Auto Large Stage
Travel Range:
X=150mm, Y=150mm, Z=60mm,
R=360°, T=-5°~+70°
Touch Alert & Stop Function
Max Specimen Dia.175mm, Height 35mm Dia.175mm, Height 20mm Dia.340mm, Height 50mm
Image System Real Still Image Max Resolution 4096x4096 Pixels,
Image File Format: BMP(Default), GIF, JPG, PNG, TIF
Real Still Image Max Resolution 16384x16384 Pixels,
Image File Format: TIF(Default), BMP, GIF, JPG, PNG
Video: Auto Record Digital .AVI Video
Real Still Image Max Resolution 16384x16384 Pixels,
Image File Format: TIF(Default), BMP, GIF, JPG, PNG
Video: Auto Record Digital .AVI Video
Computer & Software PC Work Station Win 10 System, With Professional Image Analysis Software To Fully Control Whole SEM Microscope Operation, Computer Specification No Less Than Inter I5 3.2GHz, 4G Memory, 24" IPS LCD Monitor, 500G Hard Disk, Mouse, Keyboard
Photo Display The Image Level Is Rich And Meticulous, Showing Real Time Magnification, Ruler, Voltage, Gray Curve
Dimension
& Weight
Microscope Body 800x800x1850mm
Working Table 1340x850x740mm
Total Weight 400Kg
Microscope Body 800x800x1480mm
Working Table 1340x850x740mm
Total Weight 450Kg
Microscope Body 1000x1000x1730mm
Working Table 1330x850x740mm
Total Weight 550Kg
Optional Accessories
Optional Accessories A50.7002 EDS Energy Dispersive X-Ray Spectrometer
A50.7011 Ion Sputtering Coater
A50.7001 BSE Back Scattering Electron Detector
A50.7002 EDS Energy Dispersive X-Ray Spectrometer
A50.7011 Ion Sputtering Coater
A50.7030 Motorize Control Panel
A50.7001 BSE Back Scattering Electron Detector
A50.7002 EDS Energy Dispersive X-Ray Spectrometer
A50.7011 Ion Sputtering Coater
A50.7030 Motorize Control Panel
 
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A50.7001 BSE Detector Semiconductor Four Segment Back Scattering Detector;
Available In Ingredients A+B, Morphology Info A-B;
Available Sample Observe Without Sputtering Gold;
Available In Observe Impurity And Distribution From Grayscale Map Directly.
A50.7002 EDS (X Ray Detector) Silicon Nitride (Si3N4) Window To Optimize Low Energy X-ray Transmission For Light Element Analysis;
Excellent Resolution And Their Advanced Low-noise Electronics Provide Outstanding Throughput Performance;
The Small Footprint Offers Flexibility To Ensure Ideal Geometry And Aata Collection Conditions;
The Detectors Contain A 30mm2 Chip.
A50.7003 EBSD (Electron Beam Backscattered Diffraction) user could analysis crystal orientation, crystal phase and micro texture of materials and related materials performance,etc.
automatic optimization of EBSD camera settings
during the data collection, do interactive real-time analysis  to obtain maximum information
all the data were branded with time tag, which can be viewed at any time
high resolution 1392 x 1040 x 12
Scanning and index speed: 198 points / sec, with Ni as the standard, under the condition of 2~5nA, it can ensure the index rate ≥99%;
works well under the condition of low beam current and low voltage of 5kV at 100pA
orientation measuring accuracy: Better than 0.1 degrees
Using triplex index system: no need rely on single band definition , easy indexing of poor pattern quality
dedicated database: EBSD special database obtained by electron diffraction: >400 phase structure
Index ability: it can automatically index all crystal materials of 7 crystal systems.
The advanced options include calculating elastic stiffness (Elastic Stiffness), Taylor (Taylor) factor, Schmidt (Schmid) factor and so on.
A50.7010 Coating Machine Glass Protecting Shell: ∮250mm; 340mm High;
Glass Processing Chamber:
∮88mm; 140mm High, ∮88mm; 57mm High;
Specimen Stage Size: ∮40mm (max);
Vacuum System:molecula Pump And Mechanical Pump;
Vacuum Detection: Pirani Gage;
Vacuum:better Than 2 X 10-3 Pa;
Vacuum Protection:20 Pa With Microscale Inflation Valve;
Specimen Movement: Plane Rotation,tilt Precession.
A50.7011 Ion Sputtering Coater Glass Processing Chamber: ∮100mm; 130mm High;
Specimen Stage Size: ∮40mm( Hold 6 Specimen Cups) ;
Golden Target Size: ∮58mm*0.12mm(thickness);
Vacuum Detection: Pirani Gage;
Vacuum Protection:20 Pa With Microscale Inflation Valve;
Medium Gas:argon Or Air With Argon Gas Special Air Inlet And Gas Regulating In Microscale.
A50.7012 Argon Ion Sputtering Coater The Sample Was Plated With Carbon And Gold Under High Vacuum;
Rotatable Sample Table, Uniform Coating, Particle Size About 3-5nm;
No Selection Of Target Material, No Damage To Samples;
The Functions Of Ion Cleaning And Ion Thinning Can Be Realized.
A50.7013 Critical Point Dryer Inner Diameter: 82mm, Inner Length: 82mm;
Pressure Range:0-2000psi;
Temperature Range:0°-50° C (32°-122° F)
A50.7014 Electron Beam Lithography Based On Scanning Electron Microscope, A Novel Nano-exposure System Was Developed;      
The Modificaton Has Kept All The Sem Functions For Making Nanoscale Line Width Image;
The Modificated Ebl System Widly Applied Into Microelectronic Devices, Optoelectronic Devices, Quantun Devices, Microelectronics System R&d.
 
High Resolution Digital Optical Microscope Upgradeable Lab6 Huge Sample Stage 17
A63.7069 Standard Consumables Outfit
1 Tungsten Filament Pre-centered, Imported 1 Box (5 pcs)
2 Sample Cup Dia.13mm 5 Pcs
3 Sample Cup Dia.32mm 5 Pcs
4 Carbon Double-sided Conductive Tape 6mm 1 Package
5 Vacuum Grease   10 Pcs
6 Hairless Cloth   1 Tube
7 Polishing Paste   1 Pc
8 Sample Box   2 Bags
9 Cotton Swab   1 Pc
10 Oil Mist Filter   1 Pc
A63.7069 Standard Tools & Parts Outfit
1 Inner Hexagon Spanner 1.5mm~10mm 1 Set
2 Tweezers Length 100-120mm 1 Pc
3 Slotted Screwdriver 2*50mm, 2*125mm 2 Pcs
4 Cross Screwdriver 2*125mmm 1 Pc
5 Diaphragm Remover   1 Pc
6 Cleaning Rod   1 Pc
7 Filament Adjustment Tool   1 Pc
8 Filament Adjusting Gasket   3 Pc
9 Tube Extractor   1 Pc
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Contact Details
Opto-Edu (Beijing) Co., Ltd.

Contact Person: Mr. Huang Xin

Tel: +8613911110627

Send your inquiry directly to us (0 / 3000)